Improvement of Energy Characteristics of Semiconductor Detectors Using Genetic Algorithms

A new charge loss correction method using genetic algorithms (GA) has been proposed to improve gamma ray energy spectrum characteristics of CdZnTe detectors. The correction method is based on the analysis of signal waveform shapes. GA recognizes the charge generation places for each signal and provides the related corrective factors of the pulse heights; the corrected energy spectrum was obtained by summing up the corrected pulses. The results for both of simulated and experimental data showed an improved energy spectrum characteristic after the correction process for 662 keV photons. This method is simple and useful for pulse shape analysis; the results demonstrate promise for the successful application of GA for digital signal processing data analysis.